Month: March 2010

New Research Facility Launched

UT Dallas and Agilent Technologies Inc. are establishing a facility at the Texas Analog Center of Excellence (TxACE) to bolster development of semiconductors that offer applications in everything from scanning people for weapons to monitoring air quality and enabling aircraft to operate more safely in poor weather conditions.

The electronics characterization facility, which will be available to industrial and government institutions using a collaborative framework, will focus on the emerging field of millimeter- and submillimeter-wave semiconductor technology.

“One of TxACE’s key goals is to help enable the emergence of silicon millimeter-wave and submillimeter-wave integrated circuits for industry,” said Ken O, director of TxACE and holder of the Texas Instruments Distinguished Chair at UT Dallas, where he is a professor of electrical engineering. “With a facility of this type in a university environment, critical barriers will be removed for research in this challenging measurement area.” (more…)