Month: October 2017

Most-Read Article in November JSSC by TxACE Prof Y. Chiu

Image: IEEE Journal of Solid-State Circuits

Abstract:

This paper presents a sub-radix-2 redundant architecture to improve the performance of switched-capacitor successive-approximation-register (SAR) analog-to-digital converters (ADCs). The redundancy not only guarantees digitally correctable static nonlinearities of the converter, it also offers means to combat dynamic errors in the conversion process, and thus, accelerating the speed of the SAR architecture. A perturbation-based digital calibration technique is also described that closely couples with the architecture choice to accomplish simultaneous identification of multiple capacitor mismatch errors of the ADC, enabling the downsizing of all sampling capacitors to save power and silicon area. A 12-bit prototype measured a Nyquist 70.1-dB signal-to-noise-plus-distortion ratio (SNDR) and a Nyquist 90.3-dB spurious free dynamic range (SFDR) at 22.5 MS/s, while dissipating 3.0-mW power from a 1.2-V supply and occupying 0.06-mm2 silicon area in a 0.13-μm CMOS process. The figure of merit (FoM) of this ADC is 51.3 fJ/step measured at 22.5 MS/s and 36.7 fJ/step at 45 MS/s.

Annual TxACE Symposium is on October 16, 2017

Davidson Auditorium, The University of Texas at Dallas

 

As electronics continue to bridge the gap between the analog real world and digital information infrastructure, the entire $350 billion per year integrated circuits industry is evolving into an analog-digital mixed signal industry. This one-day symposium will examine trends, emerging opportunities and key challenges in analog integrated circuits and systems, as well as related technologies.

The list of speakers will include:
Hans Stork — Senior Vice President and CTO of ON Semiconductor
Alessandro Piovaccari — Senior Vice President of Engineering and CTO, Silicon Labs
Brian La Cour — Director, Center for Quantum Research, ARL, UT Austin
Mike Flynn — Professor, U Michigan, Leader of Fund. Analog Thrust, TxACE
Yiorgos Makris — Professor, UT Dallas
Fredrick A. Jenet — Associate Professor of Physics, UT Rio Grande Valley
Adrian Tang — Strategic Researcher, UCLA and NASA JPL

The symposium will feature presentations by leading analog researchers, a lunch program, and poster and demonstration sessions featuring TxACE research.

Download this year’s agenda. PDF Icon

Texas Instruments Analog Excellence Graduate Fellowship

Based at The University of Texas at Dallas, The Texas Analog Center of Excellence (TxACE) is focused on analog and mixed signals, circuits and systems research benefiting the areas of energy efficiency, health care, public safety and security. TxACE seeks to transform analog and mixed signals research into a holistic collaborative process that creates revolutionary integrated circuits and systems driven by both great societal needs and industry.

TxACE offers the TI Analog Excellence Graduate Fellowship to a full-time graduate student who is interested in pursuing PhD research in analog circuit design and engineering at UT Dallas. The awardee will receive a fellowship of $25,000/year in addition to a research assistantship (RA) appointment sponsored by a UTD faculty member that carries additional stipends and a tuition/fee waiver for a full-time graduate load. The total award amount is approximately $70,000/year. Duration of the award is four years provided good standing at UT Dallas.

This fellowship will provide an outstanding research and educational opportunity for students with potential for achievements at the highest level and is available to students who have applied for admission to a PhD degree program for Fall 2018 in the Erik Jonsson School of Engineering and Computer Science at UT Dallas.

For more information click here.