Author: axg162431

Annual TxACE Symposium is on October 16, 2017

Davidson Auditorium, The University of Texas at Dallas

 

As electronics continue to bridge the gap between the analog real world and digital information infrastructure, the entire $350 billion per year integrated circuits industry is evolving into an analog-digital mixed signal industry. This one-day symposium will examine trends, emerging opportunities and key challenges in analog integrated circuits and systems, as well as related technologies.

The list of speakers will include:
Hans Stork — Senior Vice President and CTO of ON Semiconductor
Alessandro Piovaccari — Senior Vice President of Engineering and CTO, Silicon Labs
Brian La Cour — Director, Center for Quantum Research, ARL, UT Austin
Mike Flynn — Professor, U Michigan, Leader of Fund. Analog Thrust, TxACE
Yiorgos Makris — Professor, UT Dallas
Fredrick A. Jenet — Associate Professor of Physics, UT Rio Grande Valley
Adrian Tang — Strategic Researcher, UCLA and NASA JPL

The symposium will feature presentations by leading analog researchers, a lunch program, and poster and demonstration sessions featuring TxACE research.

Download this year’s agenda. PDF Icon

TI collaborates with University of Texas at Dallas to improve wafer production efficiency – applying big data approaches to test data

The two worked together several times a year on exchanging research and results before Makris joined the University of Texas at Dallas faculty as an associate professor in the Erik Jonsson School of Engineering and Computer Science. That’s when they began to collaborate more frequently. “As we were demonstrating the new methods we were creating, we had to explore,” Makris says.

The basic premise of the research is that sampled test data from a few die locations on a wafer could determine whether all of the sites on the wafer are good or bad. This would make it possible to test far fewer die locations yet make an educated and accurate guess on the rest of the batch — dramatically reducing wafer test time. […]

Read the full article at the Texas Instruments Think.Innovate Blog.